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Measurement technology for micro-nanometer devices / Wendong Zhang, Xiujian Chou, Zongmin Ma, North University of China, Tielin Shi, Huazhong Univ. of Science and Technology, Haifei Bao, Jing Chen, Liguo Chen, Chenyang Xue, Dachao Li, Tianjin University.

by Zhang, Wendong [author.].

Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: Solaris South Tower, Singapore : John Wiley & Sons, Inc., [2017]Online access: Wiley Online Library Availability: No items available

Nanoscale standards by metrological AFM and other instruments / Ichiko Misumi.

by Misumi, Ichiko [author.] | Institute of Physics (Great Britain) [publisher.].

Material type: book Book; Format: available online remote; Literary form: Not fiction ; Audience: Specialized; Publisher: Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) : IOP Publishing, [2021]Online access: Click here to access online Availability: No items available