| 000 | 00551 a2200181 4500 | ||
|---|---|---|---|
| 999 |
_c60557 _d60557 |
||
| 005 | 20210502220049.0 | ||
| 008 | 210502b ||||| |||| 00| 0 eng d | ||
| 020 | _a9784431565925 | ||
| 082 | _a621.395 A80V | ||
| 100 | _aAsai, Shojiro | ||
| 245 | _aVLSI Design and Test for Systems Dependability | ||
| 260 |
_bSpringer _aJapan _c2019 |
||
| 300 | _ap.800 | ||
| 650 | _bElectromagnetic Noises | ||
| 650 | _bVariations in Device Characteristics | ||
| 650 | _bDesign and Development of Electronic Systems for Quality and Dependability | ||
| 942 | _cBK | ||