Characterization of high Tc materials and devices by electron microscopy / (Record no. 82256)
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000 -LEADER | |
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fixed length control field | 03300nam a2200385 i 4500 |
001 - CONTROL NUMBER | |
control field | CR9780511534829 |
003 - CONTROL NUMBER IDENTIFIER | |
control field | UkCbUP |
005 - DATE AND TIME OF LATEST TRANSACTION | |
control field | 20230516164918.0 |
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS | |
fixed length control field | m|||||o||d|||||||| |
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION | |
fixed length control field | cr|||||||||||| |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 090429s2000||||enk o ||1 0|eng|d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 9780511534829 (ebook) |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
Canceled/invalid ISBN | 9780521554909 (hardback) |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
Canceled/invalid ISBN | 9780521031707 (paperback) |
040 ## - CATALOGING SOURCE | |
Original cataloging agency | UkCbUP |
Language of cataloging | eng |
Description conventions | rda |
Transcribing agency | UkCbUP |
050 00 - LIBRARY OF CONGRESS CALL NUMBER | |
Classification number | QC611.98.H54 |
Item number | C43 2000 |
082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 537.6/23/0284 |
Edition number | 21 |
245 00 - TITLE STATEMENT | |
Title | Characterization of high Tc materials and devices by electron microscopy / |
Statement of responsibility, etc. | edited by Nigel D. Browning, Stephen J. Pennycook. |
246 3# - VARYING FORM OF TITLE | |
Title proper/short title | Characterization of High Tc Materials & Devices by Electron Microscopy |
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE | |
Place of production, publication, distribution, manufacture | Cambridge : |
Name of producer, publisher, distributor, manufacturer | Cambridge University Press, |
Date of production, publication, distribution, manufacture, or copyright notice | 2000. |
300 ## - PHYSICAL DESCRIPTION | |
Extent | 1 online resource (xii, 391 pages) : |
Other physical details | digital, PDF file(s). |
336 ## - CONTENT TYPE | |
Content type term | text |
Content type code | txt |
Source | rdacontent |
337 ## - MEDIA TYPE | |
Media type term | computer |
Media type code | c |
Source | rdamedia |
338 ## - CARRIER TYPE | |
Carrier type term | online resource |
Carrier type code | cr |
Source | rdacarrier |
500 ## - GENERAL NOTE | |
General note | Title from publisher's bibliographic system (viewed on 05 Oct 2015). |
505 00 - FORMATTED CONTENTS NOTE | |
Miscellaneous information | 1. |
Title | High-resolution transmission electron microscopy / |
Statement of responsibility | S. Horiuchi and L. He -- |
Miscellaneous information | 2. |
Title | Holography in the transmission electron microscope / |
Statement of responsibility | A. Tonomura -- |
Miscellaneous information | 3. |
Title | Microanalysis by scanning transmission electron microscopy / |
Statement of responsibility | L.M. Brown and J. Yuan -- |
Miscellaneous information | 4. |
Title | Specimen preparation for transmission electron microscopy / |
Statement of responsibility | J.G. Wen -- |
Miscellaneous information | 5. |
Title | Low-temperature scanning electron microscopy / |
Statement of responsibility | R.P. Huebener -- |
Miscellaneous information | 6. |
Title | Scanning tunneling microscopy / |
Statement of responsibility | M.E. Hawley -- |
Miscellaneous information | 7. |
Title | Identification of new superconducting compounds by electron microscopy / |
Statement of responsibility | G. Van Tendeloo and T. Krekels -- |
Miscellaneous information | 8. |
Title | Valence band electron energy loss spectroscopy (EELS) of oxide superconductors / |
Statement of responsibility | Y.Y. Wang and V.P. Dravid. |
520 ## - SUMMARY, ETC. | |
Summary, etc. | This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | High temperature superconductors. |
9 (RLIN) | 15900 |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Electron microscopy |
General subdivision | Technique. |
9 (RLIN) | 68137 |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | Browning, Nigel D., |
Relator term | editor. |
9 (RLIN) | 68138 |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | Pennycook, Stephen J., |
Relator term | editor. |
9 (RLIN) | 68139 |
776 08 - ADDITIONAL PHYSICAL FORM ENTRY | |
Relationship information | Print version: |
International Standard Book Number | 9780521554909 |
856 40 - ELECTRONIC LOCATION AND ACCESS | |
Uniform Resource Identifier | <a href="https://doi.org/10.1017/CBO9780511534829">https://doi.org/10.1017/CBO9780511534829</a> |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | eBooks |
No items available.