Signal integrity effects in custom IC and ASIC designs / (Record no. 59561)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 11218nam a2202125 i 4500 |
| 001 - CONTROL NUMBER | |
| control field | 5273263 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20200421114116.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 151221s2001 njua ob 001 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9780470546413 |
| -- | electronic |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| -- | |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| -- | electronic |
| 082 04 - CLASSIFICATION NUMBER | |
| Call Number | 621.3815 |
| 245 00 - TITLE STATEMENT | |
| Title | Signal integrity effects in custom IC and ASIC designs / |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | 1 PDF (xiv, 451 pages) : |
| 505 0# - FORMATTED CONTENTS NOTE | |
| Remark 2 | Foreword -- From the Early Days of CMOS to Today -- Signal Integrity: A Problem for Design and CAD Engineers -- Preface -- Acknowledgments -- Signal Integrity Effects in Systme-on-Chip Designs - A Designer's Perspective -- Part 1: Interconnect Crosstalk -- Harmony: Static Noise Analysis of Deep Submicron Digital Integrated Circuits -- FastCap: A Multipole Accelerated 3-D Capacitance Extraction Program -- Efficient Coupled Noise Estimation for On-Chip Interconnects -- Switching Window Computation for Static Timing Analysis in Presence of Crosstalk Noise -- Digital Sensitivity: Predicting Signal Interaction using Functional Analysis -- Crosstalk Reduction for VLSI -- Noise-aware Repeater Insertion and Wire Sizing For On-Chip Interconnect Hierarchical Moment-Matching -- Post Global Routing Crosstalk Synthesis -- Minimum Crosstalk Channel Routing -- Reducing Cross-Coupling among Interconnect Wires in Deep-Submicron Datapath Design -- A Postprocessing Algorithm for Crosstalk-driven Wire Perturbation -- Noise in Digital Dynamic CMOS Circuits -- Design of Dynamic Circuits with Enhanced Noise Tolerance -- Coupling-Driven Signal Encoding Scheme for Low-Power Interface Design -- High Frequency Simulation and Characterization of Advanced Copper Interconnects -- Static Noise Analysis for Digital Integrated Circuits in Partially-Depleted Silicon-On-Insulator Technology -- Synthesis of CMOS Domino Circuits for Charge Sharing Alleviation -- Part 2: Inductance Effects -- On-Chip Wiring Design Challenges for Gigahertz Operation -- IC Analyses Including Extracted Inductance Models -- FASTHENRY: A Multipole-Accelerated 3-D Inductance Extraction Program -- Full-Chip, Three-Dimensional, Shapes-Based RLC Extraction -- On-Chip Inductance Modeling and Analysis -- How to Efficiently Capture On-Chip Inductance Effects: Introducing a New Circuit Element K -- Figures of Merit to Characterize the Importance of On-Chip Inductance -- Layout-Techniques for Minimizing On-Chip Interconnect Self Inductance. |
| 505 8# - FORMATTED CONTENTS NOTE | |
| Remark 2 | A Twisted-Bundle Layout Structure for Minimizing Inductive Coupling Noise -- Part 3: Power Grid and Distribution Noise -- Full-Chip Verification of UDSM Designs -- Power Supply Noise in Future IC's: A Crystal Ball Reading -- A Floorplan-based Planning Methodology for Power and Clock Distribution in ASICs -- Power Supply Noise Analysis Methodology for Deep-Submicron VLSI Chip Design -- Analysis of Performance Impact Caused by Power Supply Noise in Deep Submicron Devices -- Full-Chip Signal Interconnect Analysis for Electromigration Reliability -- Power Dissipation Analysis and Optimization of Deep Submicron CMOS Digital Circuits -- Simulation and Optimization of the Power Distribution Network in VLSI Circuits -- Design Strategies and Decoupling Techniques for Reducing the Effects of Electrical Interference in Mixed-Mode IC's -- Design and Analysis of Power Distribution Networks in Power PC Microprocessors -- Modeling the Power and Ground Effects of BGA Packages -- Effects of Power/Ground Via Distribution on the Power/Ground Performance of C4/BGA Packages -- Power Distribution Fidelity of Wirebond Compared to Flip Chip Devices in Grid Array Packages -- Forming Damped LRC Parasitic Circuits in Simultaneously Switched CMOS Output Buffers -- Part 4: Substrate Noise -- Experimental Results and Modeling Techniques for Substrate Noise in Mixed-Signal Integrated Circuits -- Principles of Substrate Crosstalk Generation in CMOS Circuits -- Experimental Comparison of Substrate Noise Coupling Using Different Wafer Types -- Modeling and Analysis of Substrate Coupling in Integrated Circuits -- Fast Methods for Extraction and Sparsification of Substrate Coupling -- SUBWAVE: A Methodology for Modeling Digital Substrate Noise Injection in Mixed-Signal ICs -- Substrate Modeling and Lumped Substrate Resistance Extraction for CMOS ESD/Latchup Circuit Simulation -- Analysis of Ground-Bounce Induced Substrate Noise Coupling in a Low Resistive Bulk Epitaxial Process: Design Strategies to Minimize Noise Effects on a Mixed-Signal Chip. |
| 505 8# - FORMATTED CONTENTS NOTE | |
| Remark 2 | A Methodology for Measurement and Characterization of Substrate Noise in High Frequency Circuits -- Measurement of Digital Noise in Mixed-Signal Integrated Circuits -- Effects of Substrate Resistances on LNA Performance and a Bondpad Structure for Reducing the Effects in a Silicon Bipolar Technology -- A Study of Oscillator Jitter Due to Supply and Substrate Noise -- CMOS Technology Characterization for Analog and RF Design -- Noise Reduction Is Crucial to Mixed-Signal ASIC Design Success (Parts I & II) -- Author Index -- Subject Index -- About the Editor. |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc | "...offers a tutorial guide to IC designers who want to move to the next level of chip design by unlocking the secrets of signal integrity." -Jake Buurma, Senior Vice President, Worldwide Research & Development, Cadence Design Systems, Inc. . Covers signal integrity effects in high performance Radio Frequency (RF) IC. Brings together research papers from the past few years that address the broad range of issues faced by IC designers and CAD managers now and in the future A Wiley-IEEE Press publication. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| General subdivision | Design and construction. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| General subdivision | Design and construction. |
| 700 1# - AUTHOR 2 | |
| Author 2 | Singh, Raminderpal. |
| 856 42 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5273263 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | eBooks |
| 264 #1 - | |
| -- | Piscataway, New Jersey : |
| -- | IEEE Press, |
| -- | c2002. |
| 264 #2 - | |
| -- | [Piscataqay, New Jersey] : |
| -- | IEEE Xplore, |
| -- | [2001] |
| 336 ## - | |
| -- | text |
| -- | rdacontent |
| 337 ## - | |
| -- | electronic |
| -- | isbdmedia |
| 338 ## - | |
| -- | online resource |
| -- | rdacarrier |
| 588 ## - | |
| -- | Description based on PDF viewed 12/21/2015. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Integrated circuits |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Application specific integrated circuits |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Signal processing. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Signal integrity (Electronics) |
| 695 ## - | |
| -- | Acceleration |
| 695 ## - | |
| -- | Algorithm design and analysis |
| 695 ## - | |
| -- | Aluminum |
| 695 ## - | |
| -- | Analog circuits |
| 695 ## - | |
| -- | Analytical models |
| 695 ## - | |
| -- | Approximation methods |
| 695 ## - | |
| -- | Arrays |
| 695 ## - | |
| -- | Attenuation |
| 695 ## - | |
| -- | Benchmark testing |
| 695 ## - | |
| -- | Biographies |
| 695 ## - | |
| -- | Biological system modeling |
| 695 ## - | |
| -- | Bonding |
| 695 ## - | |
| -- | Boolean functions |
| 695 ## - | |
| -- | CMOS integrated circuits |
| 695 ## - | |
| -- | Capacitance |
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| -- | Capacitors |
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| -- | Central Processing Unit |
| 695 ## - | |
| -- | Clocks |
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| -- | Codecs |
| 695 ## - | |
| -- | Computational modeling |
| 695 ## - | |
| -- | Conductivity |
| 695 ## - | |
| -- | Conductors |
| 695 ## - | |
| -- | Copper |
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| -- | Couplings |
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| -- | Crosstalk |
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| -- | Current density |
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| -- | Current distribution |
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| -- | Current measurement |
| 695 ## - | |
| -- | Decoding |
| 695 ## - | |
| -- | Delay |
| 695 ## - | |
| -- | Dielectrics |
| 695 ## - | |
| -- | Discrete cosine transforms |
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| -- | Distance measurement |
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| -- | Driver circuits |
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| -- | Eigenvalues and eigenfunctions |
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| -- | Electric potential |
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| -- | Electrical resistance measurement |
| 695 ## - | |
| -- | Electromigration |
| 695 ## - | |
| -- | Electrostatic discharge |
| 695 ## - | |
| -- | Electrostatics |
| 695 ## - | |
| -- | Encoding |
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| -- | Equations |
| 695 ## - | |
| -- | Estimation |
| 695 ## - | |
| -- | FETs |
| 695 ## - | |
| -- | Finite difference methods |
| 695 ## - | |
| -- | Flip-flops |
| 695 ## - | |
| -- | Fluctuations |
| 695 ## - | |
| -- | Force |
| 695 ## - | |
| -- | Frequency domain analysis |
| 695 ## - | |
| -- | Frequency measurement |
| 695 ## - | |
| -- | Frequency modulation |
| 695 ## - | |
| -- | Frequency response |
| 695 ## - | |
| -- | Geometry |
| 695 ## - | |
| -- | Green function |
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| -- | Impact ionization |
| 695 ## - | |
| -- | Impedance |
| 695 ## - | |
| -- | Indexes |
| 695 ## - | |
| -- | Inductance |
| 695 ## - | |
| -- | Integral equations |
| 695 ## - | |
| -- | Integrated circuit interconnections |
| 695 ## - | |
| -- | Integrated circuit modeling |
| 695 ## - | |
| -- | Integrated circuit noise |
| 695 ## - | |
| -- | Integrated circuit reliability |
| 695 ## - | |
| -- | Inverters |
| 695 ## - | |
| -- | Jitter |
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| -- | Junctions |
| 695 ## - | |
| -- | Latches |
| 695 ## - | |
| -- | Layout |
| 695 ## - | |
| -- | Leakage current |
| 695 ## - | |
| -- | Logic gates |
| 695 ## - | |
| -- | MOS devices |
| 695 ## - | |
| -- | MOSFETs |
| 695 ## - | |
| -- | Magnetic flux |
| 695 ## - | |
| -- | Mathematical model |
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| -- | Measurement |
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| -- | Metals |
| 695 ## - | |
| -- | Microprocessors |
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| -- | Minimization |
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| -- | Mixers |
| 695 ## - | |
| -- | Multiplexing |
| 695 ## - | |
| -- | Nearest neighbor searches |
| 695 ## - | |
| -- | Noise |
| 695 ## - | |
| -- | Noise figure |
| 695 ## - | |
| -- | Noise measurement |
| 695 ## - | |
| -- | Numerical models |
| 695 ## - | |
| -- | Optimization |
| 695 ## - | |
| -- | Oscillators |
| 695 ## - | |
| -- | Packaging |
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| -- | Parasitic capacitance |
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| -- | Pins |
| 695 ## - | |
| -- | Power dissipation |
| 695 ## - | |
| -- | Power filters |
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| -- | Power grids |
| 695 ## - | |
| -- | Power supplies |
| 695 ## - | |
| -- | Power system dynamics |
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| -- | Power systems |
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| -- | Power transmission lines |
| 695 ## - | |
| -- | Program processors |
| 695 ## - | |
| -- | Propagation delay |
| 695 ## - | |
| -- | RLC circuits |
| 695 ## - | |
| -- | Radio frequency |
| 695 ## - | |
| -- | Rails |
| 695 ## - | |
| -- | Receivers |
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| -- | Repeaters |
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| -- | Resistance |
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| -- | Resistors |
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| -- | Resonant frequency |
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| -- | Ring oscillators |
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| -- | Routing |
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| -- | SPICE |
| 695 ## - | |
| -- | Semiconductor device measurement |
| 695 ## - | |
| -- | Semiconductor device modeling |
| 695 ## - | |
| -- | Semiconductor process modeling |
| 695 ## - | |
| -- | Sensitivity |
| 695 ## - | |
| -- | Sensitivity analysis |
| 695 ## - | |
| -- | Simulation |
| 695 ## - | |
| -- | Sparse matrices |
| 695 ## - | |
| -- | Steady-state |
| 695 ## - | |
| -- | Substrates |
| 695 ## - | |
| -- | Switches |
| 695 ## - | |
| -- | Switching circuits |
| 695 ## - | |
| -- | System-on-a-chip |
| 695 ## - | |
| -- | Threshold voltage |
| 695 ## - | |
| -- | Time domain analysis |
| 695 ## - | |
| -- | Topology |
| 695 ## - | |
| -- | Transistors |
| 695 ## - | |
| -- | Transmission line matrix methods |
| 695 ## - | |
| -- | Voltage measurement |
| 695 ## - | |
| -- | Voltage-controlled oscillators |
| 695 ## - | |
| -- | Wire |
| 695 ## - | |
| -- | Wires |
| 695 ## - | |
| -- | Wiring |
No items available.